TY - JOUR UR - http://lib.ugent.be/catalog/pug01:8537373 ID - pug01:8537373 LA - eng TI - Atomic layer deposition of nanoalloys of noble and non-noble metals PY - 2017 JO - (2017) ECS TRANSACTIONS SN - 1938-5862 PB - 2017 AU - Karuparambil Ramachandran, Ranjith WE04 000110593639 AU - Dendooven, Jolien WE04 002003260972 802000407133 0000-0002-2385-3693 AU - Filez, Matthias TW11 000110122076 AU - Galvita, Vladimir TW11 000171232581 AU - Poelman, Hilde AU - Solano Minuesa, Eduardo WE04 000140713452 AU - Minjauw, Matthias WE04 000080232841 AU - Marin, Guy TW11 801000453028 0000-0002-6733-1213 AU - Detavernier, Christophe WE04 801001185275 0000-0001-7653-0858 AB - We present a novel ALD-based approach for the synthesis of bimetallic materials consisting of a noble metal along with a nonnoble metal such as Pt-M (M = In, Ga, Sn, etc.), with a precise control on the composition and size. First, a bilayer consisting of a metal oxide and a Pt film of the desired thickness is deposited on to the substrate. The film is then subjected to a temperature programmed reduction (TPR) under H2 atmosphere. In situ X-ray diffraction (XRD) measurements during TPR revealed the formation of Pt±M bimetallic alloys with a phase determined by the Pt/(Pt + M) atomic ratio of the as-deposited bilayer. Scanning electron microscopic (SEM) analysis revealed the formationnanoparticles after annealing, with the particle size controlled by the initial total thickness of the bilayer. ER -Download RIS file
| 00000nam^a2200301^i^4500 | |||
| 001 | 8537373 | ||
| 005 | 20171117100233.0 | ||
| 008 | 171114s2017------------------------eng-- | ||
| 022 | a 1938-5862 | ||
| 024 | a 1854/LU-8537373 2 handle | ||
| 024 | a 10.1149/08003.0097ecst 2 doi | ||
| 040 | a UGent | ||
| 245 | a Atomic layer deposition of nanoalloys of noble and non-noble metals | ||
| 260 | c 2017 | ||
| 520 | a We present a novel ALD-based approach for the synthesis of bimetallic materials consisting of a noble metal along with a nonnoble metal such as Pt-M (M = In, Ga, Sn, etc.), with a precise control on the composition and size. First, a bilayer consisting of a metal oxide and a Pt film of the desired thickness is deposited on to the substrate. The film is then subjected to a temperature programmed reduction (TPR) under H2 atmosphere. In situ X-ray diffraction (XRD) measurements during TPR revealed the formation of Pt±M bimetallic alloys with a phase determined by the Pt/(Pt + M) atomic ratio of the as-deposited bilayer. Scanning electron microscopic (SEM) analysis revealed the formationnanoparticles after annealing, with the particle size controlled by the initial total thickness of the bilayer. | ||
| 598 | a A2 | ||
| 100 | a Karuparambil Ramachandran, Ranjith u WE04 0 000110593639 0 802001075019 | ||
| 700 | a Dendooven, Jolien u WE04 0 002003260972 0 802000407133 0 0000-0002-2385-3693 | ||
| 700 | a Filez, Matthias u TW11 0 000110122076 0 802001049151 | ||
| 700 | a Galvita, Vladimir u TW11 0 000171232581 0 802000598103 | ||
| 700 | a Poelman, Hilde u TW11 0 801000771108 | ||
| 700 | a Solano Minuesa, Eduardo u WE04 0 000140713452 0 802001807973 | ||
| 700 | a Minjauw, Matthias u WE04 0 000080232841 0 802001597001 | ||
| 700 | a Marin, Guy u TW11 0 801000453028 0 0000-0002-6733-1213 | ||
| 700 | a Detavernier, Christophe u WE04 0 801001185275 0 0000-0001-7653-0858 | ||
| 773 | t ECS TRANSACTIONS g ECS TRANSACTIONS. 2017. 80 (3) p.97-103 q 80:3<97 | ||
| 856 | 3 Full Text u https://biblio.ugent.be/publication/8537373/file/8537375 z [open] y Ramachandran_ECSTVol803_Oct17.pdf | ||
| 920 | a article | ||
| 852 | x EA b TW11 | ||
| 922 | a UGENT-EA | ||
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