TY - JOUR UR - http://lib.ugent.be/catalog/pug01:6964896 ID - pug01:6964896 LA - eng TI - Deep levels in W-doped Czochralski silicon PY - 2016 JO - (2016) ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY SN - 2162-8769 PB - 2016 AU - Simoen, Eddy AU - Saga, Koichiro AU - Vrielinck, Henk WE04 801001084942 0000-0003-4861-9630 AU - Lauwaert, Johan TW06 001999337021 801001746663 0000-0002-0757-2509 ER -Download RIS file
| 00000nam^a2200301^i^4500 | |||
| 001 | 6964896 | ||
| 005 | 20170426111258.0 | ||
| 008 | 151022s2016------------------------eng-- | ||
| 022 | a 2162-8769 | ||
| 024 | a 000373212500002 2 wos | ||
| 024 | a 1854/LU-6964896 2 handle | ||
| 024 | a 10.1149/2.0011604jss 2 doi | ||
| 040 | a UGent | ||
| 245 | a Deep levels in W-doped Czochralski silicon | ||
| 260 | c 2016 | ||
| 598 | a A1 | ||
| 100 | a Simoen, Eddy u WE04 0 801000453735 | ||
| 700 | a Saga, Koichiro | ||
| 700 | a Vrielinck, Henk u WE04 0 801001084942 0 0000-0003-4861-9630 | ||
| 700 | a Lauwaert, Johan u TW06 0 001999337021 0 801001746663 0 0000-0002-0757-2509 | ||
| 650 | a Physics and Astronomy | ||
| 653 | a TRANSIENT SPECTROSCOPY | ||
| 653 | a ELECTRIC-FIELD | ||
| 653 | a DEFECT STATES | ||
| 653 | a TUNGSTEN | ||
| 653 | a MOLYBDENUM | ||
| 653 | a JUNCTIONS | ||
| 653 | a DISLOCATIONS | ||
| 653 | a IMPURITIES | ||
| 653 | a PLATINUM | ||
| 653 | a TRAPS | ||
| 773 | t ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY g ECS J. Solid State Sci. Technol. 2016. 5 (4) p.P3001-P3007 q 5:4<P3001 | ||
| 856 | 3 Full Text u https://biblio.ugent.be/publication/6964896/file/6964917 z [ugent] y SimoenECSJSolidState2016.pdf | ||
| 920 | a article | ||
| 852 | x WE b WE04 | ||
| 922 | a UGENT-WE | ||
| 852 | x EA b TW06 | ||
| 922 | a UGENT-EA | ||
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